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Glancing Ion Incidence On A Graphite-supported Graphene Flake: Lift-off Vs Welding

Glancing Ion Incidence On A Graphite-supported Graphene Flake: Lift-off Vs Welding
Yudi Rosandi, Herbert M. Urbassek
Universitas Padjadjaran, Nuclear Instruments and Methods in Physics Research B 409 (2017) 111–115, journal homepage: www.elsevier.com/locate/nimb, http://dx.doi.org/10.1016/j.nimb.2017.04.011
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Universitas Padjadjaran, Nuclear Instruments and Methods in Physics Research B 409 (2017) 111–115, journal homepage: www.elsevier.com/locate/nimb, http://dx.doi.org/10.1016/j.nimb.2017.04.011
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Using molecular-dynamics simulation, we study the impact of 0.5 keV Xe ions at glancing incidence (80o from the surface normal) on a graphene flake supported on a (0001) graphite substrate. The step forming at the ascending edge of the flake allows the entrance of glancing-incidence ions into a subsurface channel between graphene layers. We find that subsurface-channeled ions have a high probability to lift the flake off the substrate, while non-channeled projectiles rather damage the flake leading eventually to welding the flake to the substrate by the formation of sp3 bonds.

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